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Partname:V62/03626-01XE
Description:Military Enhanced Plastic 3.3-V Dual UART With 64-Byte FIFO
Manufacturer:Texas Instruments
Datasheet:PDF (476K).
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The TL16C752B-EP is a dual-universal asynchronous receiver/transmitter (UART) with 64-byte FIFOs, automatic hardware/software flow control, and data rates up to 3 Mbps. The TL16C752B-EP offers enhanced features. It has a transmission control register (TCR) that stores receiver FIFO threshold levels to start/stop transmission during hardware and software flow control. With the FIFO RDY register, the software gets the status of TXRDY/RXRDY for all four ports in one access. On-chip status registers provide the user with error indications, operational status, and modem interface control. System interrupts may be tailored to meet user requirements. An internal loopback capability allows onboard diagnostics. The UART transmits data, sent to it over the peripheral 8-bit bus, on the TX signal and receives characters on the RX signal. Characters can be programmed to be 5, 6, 7, or 8 bits. The UART has a 64-byte receive FIFO and transmit FIFO and can be programmed to interrupt at different trigger levels. The UART generates its own desired baud rate based upon a programmable divisor and its input clock. It can transmit even, odd, or no parity and 1, 1.5, or 2 stop bits. The receiver can detect break, idle, or framing errors, FIFO overflow, and parity errors. The transmitter can detect FIFO underflow. The UART also contains a software interface for modem control operations, and has software flow control and hardware flow control capabilities. Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet. Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits. Copyright 2003, Texas Instruments Incorporated

Click here to download V62/03626-01XE Datasheet
Click here to download V62/03626-01XE Datasheet
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