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Partname: | SNJ54BCT8373AJT |
Description: | SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES |
Manufacturer: | Texas Instruments |
Package: | JT |
Pins: | 24 |
Oper. temp.: | -55 to 125 |
Datasheet: | PDF (294K). Click here to download *) |
The 'BCT8373A scan test devices with octal D-type latches are members of the Texas Instruments SCOPETM testability integratedcircuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit board assemblies. Scan access to the test circuitry is accomplished via the 4-wire test access port (TAP) interface. |
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