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Partname: | SNJ54BCT8240AFK |
Description: | SCAN TEST DEVICES WITH OCTAL BUFFERS |
Manufacturer: | Texas Instruments |
Package: | FK |
Pins: | 28 |
Oper. temp.: | -55 to 125 |
Datasheet: | PDF (293K). Click here to download *) |
The 'BCT8240A scan test devices with octal buffers are members of the Texas Instruments SCOPETM testability integrated-circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Scan access to the test circuitry is accomplished via the 4-wire test access port (TAP) interface. |
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Click here to download SNJ54BCT8240AFK Datasheet*) |
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