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Partname: | SNJ54ABT18245AWD |
Description: | SCAN TEST DEVICES WITH 18-BIT BUS TRANSCEIVERS |
Manufacturer: | Texas Instruments |
Package: | WD |
Pins: | 56 |
Oper. temp.: | -55 to 125 |
Datasheet: | PDF (357K). Click here to download *) |
The 'ABT18245A scan test devices with 18-bit bus transceivers are members of the Texas Instruments SCOPETM testability integratedcircuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Scan access to the test circuitry is accomplished via the 4-wire test access port (TAP) interface. |
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Click here to download SNJ54ABT18245AWD Datasheet*) |
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