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Partname: | SN74LVTH182514 |
Description: | 3.3-V ABT SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS |
Manufacturer: | Texas Instruments |
Datasheet: | PDF (548K). Click here to download *) |
The 'LVTH18514 and 'LVTH182514 scan test devices with 20-bit universal bus transceivers are members of the TI SCOPE testability integrated-circuit family. This family of devices supports IEEE Std 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Scan access to the test circuitry is accomplished via the 4-wire test access port (TAP) interface. Additionally, these devices are designed specifically for low-voltage (3.3-V) VCC operation, but with the capability to provide a TTL interface to a 5-V system environment. |
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Click here to download SN74LVTH182514 Datasheet*) |
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