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Partname:SN74LVT182512
Description:3.3-V ABT SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS
Manufacturer:Texas Instruments
Datasheet:PDF (544K).
Click here to download *)

The 'LVT18512 and 'LVT182512 scan test devices with 18-bit universal bus transceivers are members of the Texas Instruments SCOPE TM testability integrated-circuit family. This family of devices supports IEEE Std 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Scan access to the test circuitry is accomplished via the 4-wire test access port (TAP) interface. Additionally, these devices are designed specifically for low-voltage (3.3-V) VCC operation, but with the capability to provide a TTL interface to a 5-V system environment.

Click here to download SN74LVT182512 Datasheet
Click here to download SN74LVT182512 Datasheet
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