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Partname: | SN74BCT8245ANT |
Description: | IEEE STD 1149.1 (JTAG) BOUNDARY-SCAN TEST DEVICE WITH OCTAL BUS TRANSCEIVERS |
Manufacturer: | Texas Instruments |
Package: | NT |
Pins: | 24 |
Oper. temp.: | 0 to 70 |
Datasheet: | PDF (309K). Click here to download *) |
The 'BCT8245A scan test devices with octal bus transceivers are members of the Texas Instruments SCOPETM testability integratedcircuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Scan access to the test circuitry is accomplished via the 4-wire test access port (TAP) interface. |
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Click here to download SN74BCT8245ANT Datasheet*) |
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