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| Partname: | SN74BCT8244ADWR |
| Description: | IEEE STD 1149.1 (JTAG) BOUNDARY-SCAN TEST DEVICE WITH OCTAL BUFFERS |
| Manufacturer: | Texas Instruments |
| Package: | DW |
| Pins: | 24 |
| Oper. temp.: | 0 to 70 |
| Datasheet: | PDF (293K).
Click here to download *) |
The 'BCT8244A scan test devices with octal buffers are members of the Texas Instruments SCOPETM testability integrated-circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Scan access to the test circuitry is accomplished via the 4-wire test access port (TAP) interface. |
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Click here to download SN74BCT8244ADWR Datasheet*) |
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