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Partname:SN74BCT8240ADWR
Description: IEEE STD 1149.1 (JTAG) BOUNDARY-SCAN TEST DEVICE WITH OCTAL INVERTING BUFFERS
Manufacturer:Texas Instruments
Package:DW
Pins:24
Oper. temp.:0 to 70
Datasheet:PDF (293K).
Click here to download *)

The 'BCT8240A scan test devices with octal buffers are members of the Texas Instruments SCOPETM testability integrated-circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Scan access to the test circuitry is accomplished via the 4-wire test access port (TAP) interface.

Click here to download SN74BCT8240ADWR Datasheet
Click here to download SN74BCT8240ADWR Datasheet
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