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Partname: | SN74ABT8245DWR |
Description: | SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS |
Manufacturer: | Texas Instruments |
Package: | DW |
Pins: | 24 |
Oper. temp.: | -40 to 85 |
Datasheet: | PDF (342K). Click here to download *) |
The 'ABT8245 scan test devices with octal bus transceivers are members of the Texas Instruments SCOPE TM testability integrated-circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Scan access to the test circuitry is accomplished via the 4-wire test access port (TAP) interface. |
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Click here to download SN74ABT8245DWR Datasheet*) |
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