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Partname: | SN74ABT8245DWE4 |
Description: | Scan Test Devices With Octal Bus Transceivers |
Manufacturer: | Texas Instruments |
Datasheet: | PDF (505K). Click here to download *) |
The 'ABT8245 scan test devices with octal bus transceivers are members of the Texas Instruments SCOPE TM testability integrated-circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Scan access to the test circuitry is accomplished via the 4-wire test access port (TAP) interface. |
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Click here to download SN74ABT8245DWE4 Datasheet*) |
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