The 'LVT8980 embedded test-bus controllers (eTBC) are members of the TI broad family of testability integrated circuits. This family of devices supports IEEE Std 1149.1-1990 boundary scan to facilitate testing of complex circuit assemblies. Unlike most other devices of this family, the eTBC is not a boundary-scannable device; rather, its function is to master an IEEE Std 1149.1 (JTAG) test access port (TAP) under the command of an embedded host microprocessor/microcontroller. Thus, the eTBC enables the practical and effective use of the IEEE Std 1149.1 test-access infrastructure to support embedded/built-in test, emulation, and configuration/maintenance facilities at board and system levels. Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.