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Partname: | SN54BCT8374AFK |
Description: | SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS |
Manufacturer: | Texas Instruments |
Datasheet: | PDF (294K). Click here to download *) |
The 'BCT8374A scan test devices with octal edge-triggered D-type flip-flops are members of the Texas Instruments SCOPETM testability integrated-circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Scan access to the test circuitry is accomplished via the 4-wire test access port (TAP) interface. |
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Click here to download SN54BCT8374AFK Datasheet*) |
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