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Partname:SN54BCT8245AJT
Description:SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS
Manufacturer:Texas Instruments
Datasheet:PDF (309K).
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The 'BCT8245A scan test devices with octal bus transceivers are members of the Texas Instruments SCOPETM testability integratedcircuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Scan access to the test circuitry is accomplished via the 4-wire test access port (TAP) interface.

Click here to download SN54BCT8245AJT Datasheet
Click here to download SN54BCT8245AJT Datasheet
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