|
|
Partname: | SCAN18374TMDA |
Description: | D Flip-Flop with TRI-STATE Outputs |
Manufacturer: | National Semiconductor |
Datasheet: | PDF (162K). Click here to download *) |
The SCAN18374T is a high speed, low-power D-type flip-flop featuring separate D-type inputs organized into dual 9-bit bytes with byte-oriented clock and output enable control signals. This device is compliant with IEEE 1149.1 Standard Test Access Port and BOUNDARY-SCAN Architecture with the incorporation of the defined BOUNDARY-SCAN test logic and test access port consisting of Test Data Input (TDI), Test Data Out (TDO), Test Mode Select (TMS), and Test Clock (TCK). |
|
 Click here to download SCAN18374TMDA Datasheet*) |
 |
*)Datasheets downloading from ChipDocs is only for our members (paid service). REGISTER NOW for your membership. |
|
|
|