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Partname: | ADC12V170_09 |
Description: | 12-Bit, 170 MSPS, 1.1 GHz Bandwidth A/D Converter with LVDS Outputs |
Manufacturer: | National Semiconductor |
Datasheet: | PDF (131K). Click here to download *) |
The SCAN16602 is a high speed, low-power universal bus transceiver featuring data inputs organized into two 8-bit bytes with separate output enable and latch enable control signals. The byte-wide output enable controls are complimentary to allow direction control with a single R/W line and no additional logic. This function is configurable as a D-type Latch or Flip-Flop, and can operate in transparent, latched, or clocked mode. This device is compliant with IEEE 1149.1 Standard Test Access Port and Boundary Scan Architecture with the incorporation of the defined boundary-scan test logic and test access port consisting of Test Data Input (TDI), Test Data Out (TDO), Test Mode Select (TMS), Test Clock (TCK), and Test Reset (TRST). |
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Click here to download ADC12V170_09 Datasheet*) |
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