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Partname:5962-9320701MXA
Description:D Flip-Flop with TRI-STATE Outputs
Manufacturer:National Semiconductor
Package:Cerpack
Pins:56
Datasheet:PDF (162K).
Click here to download *)

The SCAN18374T is a high speed, low-power D-type flip-flop featuring separate D-type inputs organized into dual 9-bit bytes with byte-oriented clock and output enable control signals. This device is compliant with IEEE 1149.1 Standard Test Access Port and BOUNDARY-SCAN Architecture with the incorporation of the defined BOUNDARY-SCAN test logic and test access port consisting of Test Data Input (TDI), Test Data Out (TDO), Test Mode Select (TMS), and Test Clock (TCK).

Click here to download 5962-9320701MXA Datasheet
Click here to download 5962-9320701MXA Datasheet
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