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SN74BCT8373 series datasheets. Manufacturer: Texas Instruments.

5962-9172501M3A SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES in 28-pin FK package. Operational temperature range from -55°C to 125°C.Datasheet*)
SN74BCT8373ADW IEEE STD 1149.1 (JTAG) BOUNDARY-SCAN TEST DEVICE WITH OCTAL D-TYPE LATCHES in 24-pin DW package. Operational temperature range from 0°C to 70°C.Datasheet*)
SN74BCT8373ADWR IEEE STD 1149.1 (JTAG) BOUNDARY-SCAN TEST DEVICE WITH OCTAL D-TYPE LATCHES in 24-pin DW package. Operational temperature range from 0°C to 70°C.Datasheet*)
SN74BCT8373ANT IEEE STD 1149.1 (JTAG) BOUNDARY-SCAN TEST DEVICE WITH OCTAL D-TYPE LATCHES in 24-pin NT package. Operational temperature range from 0°C to 70°C.Datasheet*)
SNJ54BCT8373AFK SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES in 28-pin FK package. Operational temperature range from -55°C to 125°C.Datasheet*)
SNJ54BCT8373AJT SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES in 24-pin JT package. Operational temperature range from -55°C to 125°C.Datasheet*)
SN74BCT8373ASCAN TEST DEVICES WITH OCTAL D-TYPE LATCHESDatasheet*)
5962-9172501MLAScan Test Devices With Octal D-type LatchesDatasheet*)
SN74BCT8373ADWE4IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal D-Type LatchesDatasheet*)
SN74BCT8373ADWRE4IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal D-Type LatchesDatasheet*)
SN74BCT8373ANTE4IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal D-Type LatchesDatasheet*)
SN74BCT8373Scan Test Device With Octal D-Type LatchesDatasheet*)
SN74BCT8373DWScan Test Device With Octal D-Type LatchesDatasheet*)
SN74BCT8373DWRScan Test Device With Octal D-Type LatchesDatasheet*)
SN74BCT8373NTScan Test Device With Octal D-Type LatchesDatasheet*)
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