SN74BCT8240ADW | IEEE STD 1149.1 (JTAG) BOUNDARY-SCAN TEST DEVICE WITH OCTAL INVERTING BUFFERS in 24-pin DW package. Operational temperature range from 0°C to 70°C. | Datasheet*) |
SN74BCT8240ADWR | IEEE STD 1149.1 (JTAG) BOUNDARY-SCAN TEST DEVICE WITH OCTAL INVERTING BUFFERS in 24-pin DW package. Operational temperature range from 0°C to 70°C. | Datasheet*) |
SN74BCT8240ANT | IEEE STD 1149.1 (JTAG) BOUNDARY-SCAN TEST DEVICE WITH OCTAL INVERTING BUFFERS in 24-pin NT package. Operational temperature range from 0°C to 70°C. | Datasheet*) |
SNJ54BCT8240AFK | SCAN TEST DEVICES WITH OCTAL BUFFERS in 28-pin FK package. Operational temperature range from -55°C to 125°C. | Datasheet*) |
SNJ54BCT8240AJT | SCAN TEST DEVICES WITH OCTAL BUFFERS in 24-pin JT package. Operational temperature range from -55°C to 125°C. | Datasheet*) |
SN74BCT8240A | SCAN TEST DEVICES WITH OCTAL INVERTING BUFFERS | Datasheet*) |
5962-9174601Q3A | Scan Test Devices With Octal Buffers | Datasheet*) |
5962-9174601QLA | Scan Test Devices With Octal Buffers | Datasheet*) |
SN74BCT8240ADWE4 | IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Inverting Buffers | Datasheet*) |
SN74BCT8240ADWRE4 | IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Inverting Buffers | Datasheet*) |
SN74BCT8240ANTE4 | IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Inverting Buffers | Datasheet*) |