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SN74BCT8240 series datasheets. Manufacturer: Texas Instruments.

SN74BCT8240ADW IEEE STD 1149.1 (JTAG) BOUNDARY-SCAN TEST DEVICE WITH OCTAL INVERTING BUFFERS in 24-pin DW package. Operational temperature range from 0°C to 70°C.Datasheet*)
SN74BCT8240ADWR IEEE STD 1149.1 (JTAG) BOUNDARY-SCAN TEST DEVICE WITH OCTAL INVERTING BUFFERS in 24-pin DW package. Operational temperature range from 0°C to 70°C.Datasheet*)
SN74BCT8240ANT IEEE STD 1149.1 (JTAG) BOUNDARY-SCAN TEST DEVICE WITH OCTAL INVERTING BUFFERS in 24-pin NT package. Operational temperature range from 0°C to 70°C.Datasheet*)
SNJ54BCT8240AFK SCAN TEST DEVICES WITH OCTAL BUFFERS in 28-pin FK package. Operational temperature range from -55°C to 125°C.Datasheet*)
SNJ54BCT8240AJT SCAN TEST DEVICES WITH OCTAL BUFFERS in 24-pin JT package. Operational temperature range from -55°C to 125°C.Datasheet*)
SN74BCT8240ASCAN TEST DEVICES WITH OCTAL INVERTING BUFFERSDatasheet*)
5962-9174601Q3AScan Test Devices With Octal BuffersDatasheet*)
5962-9174601QLAScan Test Devices With Octal BuffersDatasheet*)
SN74BCT8240ADWE4IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Inverting BuffersDatasheet*)
SN74BCT8240ADWRE4IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Inverting BuffersDatasheet*)
SN74BCT8240ANTE4IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Inverting BuffersDatasheet*)
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