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5962-9172701Q3 series datasheets. Manufacturer: Texas Instruments.
5962-9172701Q3A | SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS in 28-pin FK package. Operational temperature range from -55°C to 125°C. | Datasheet*) |
SN74BCT8374ADW | SCAN TEST DEVICE WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS in 24-pin DW package. Operational temperature range from 0°C to 70°C. | Datasheet*) |
SN74BCT8374ADWR | SCAN TEST DEVICE WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS in 24-pin DW package. Operational temperature range from 0°C to 70°C. | Datasheet*) |
SN74BCT8374ANT | SCAN TEST DEVICE WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS in 24-pin NT package. Operational temperature range from 0°C to 70°C. | Datasheet*) |
SNJ54BCT8374AFK | SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS in 28-pin FK package. Operational temperature range from -55°C to 125°C. | Datasheet*) |
SNJ54BCT8374AJT | SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS in 24-pin JT package. Operational temperature range from -55°C to 125°C. | Datasheet*) |
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