5962-9172701Q3A | SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS in 28-pin FK package. Operational temperature range from -55°C to 125°C. | Datasheet*) |
SN74BCT8374ADW | SCAN TEST DEVICE WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS in 24-pin DW package. Operational temperature range from 0°C to 70°C. | Datasheet*) |
SN74BCT8374ADWR | SCAN TEST DEVICE WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS in 24-pin DW package. Operational temperature range from 0°C to 70°C. | Datasheet*) |
SN74BCT8374ANT | SCAN TEST DEVICE WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS in 24-pin NT package. Operational temperature range from 0°C to 70°C. | Datasheet*) |
SNJ54BCT8374AFK | SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS in 28-pin FK package. Operational temperature range from -55°C to 125°C. | Datasheet*) |
SNJ54BCT8374AJT | SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS in 24-pin JT package. Operational temperature range from -55°C to 125°C. | Datasheet*) |
5962-9172701QLA | Scan Test Devices With Octal D-type Edge-Triggered Flip-Flops | Datasheet*) |
SN74BCT8374ADWE4 | Scan Test Device With Octal D-Type Edge-Triggered Flip-Flops | Datasheet*) |
SN74BCT8374ADWRE4 | Scan Test Device With Octal D-Type Edge-Triggered Flip-Flops | Datasheet*) |
SN74BCT8374ANTE4 | Scan Test Device With Octal D-Type Edge-Triggered Flip-Flops | Datasheet*) |