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5962-9172701 series datasheets. Manufacturer: Texas Instruments.

5962-9172701Q3A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS in 28-pin FK package. Operational temperature range from -55°C to 125°C.Datasheet*)
SN74BCT8374ADW SCAN TEST DEVICE WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS in 24-pin DW package. Operational temperature range from 0°C to 70°C.Datasheet*)
SN74BCT8374ADWR SCAN TEST DEVICE WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS in 24-pin DW package. Operational temperature range from 0°C to 70°C.Datasheet*)
SN74BCT8374ANT SCAN TEST DEVICE WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS in 24-pin NT package. Operational temperature range from 0°C to 70°C.Datasheet*)
SNJ54BCT8374AFK SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS in 28-pin FK package. Operational temperature range from -55°C to 125°C.Datasheet*)
SNJ54BCT8374AJT SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS in 24-pin JT package. Operational temperature range from -55°C to 125°C.Datasheet*)
5962-9172701QLAScan Test Devices With Octal D-type Edge-Triggered Flip-FlopsDatasheet*)
SN74BCT8374ADWE4Scan Test Device With Octal D-Type Edge-Triggered Flip-FlopsDatasheet*)
SN74BCT8374ADWRE4Scan Test Device With Octal D-Type Edge-Triggered Flip-FlopsDatasheet*)
SN74BCT8374ANTE4Scan Test Device With Octal D-Type Edge-Triggered Flip-FlopsDatasheet*)
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