5962-9172601M3A | SCAN TEST DEVICES WITH OCTAL BUFFERS in 28-pin FK package. Operational temperature range from -55°C to 125°C. | Datasheet*) |
SN74BCT8244ADW | IEEE STD 1149.1 (JTAG) BOUNDARY-SCAN TEST DEVICE WITH OCTAL BUFFERS in 24-pin DW package. Operational temperature range from 0°C to 70°C. | Datasheet*) |
SN74BCT8244ADWR | IEEE STD 1149.1 (JTAG) BOUNDARY-SCAN TEST DEVICE WITH OCTAL BUFFERS in 24-pin DW package. Operational temperature range from 0°C to 70°C. | Datasheet*) |
SN74BCT8244ANT | IEEE STD 1149.1 (JTAG) BOUNDARY-SCAN TEST DEVICE WITH OCTAL BUFFERS in 24-pin NT package. Operational temperature range from 0°C to 70°C. | Datasheet*) |
SNJ54BCT8244AFK | SCAN TEST DEVICES WITH OCTAL BUFFERS in 28-pin FK package. Operational temperature range from -55°C to 125°C. | Datasheet*) |
SNJ54BCT8244AJT | SCAN TEST DEVICES WITH OCTAL BUFFERS in 24-pin JT package. Operational temperature range from -55°C to 125°C. | Datasheet*) |
5962-9172601MLA | SCAN TEST DEVICES WITH OCTAL BUFFERS | Datasheet*) |
SN74BCT8244A | SCAN TEST DEVICES WITH OCTAL BUFFERS | Datasheet*) |
SN74BCT8244ADWE4 | SCAN TEST DEVICES WITH OCTAL BUFFERS | Datasheet*) |
SN74BCT8244ADWRE4 | SCAN TEST DEVICES WITH OCTAL BUFFERS | Datasheet*) |