5962-9172501M3 series datasheets. Manufacturer: Texas Instruments.

5962-9172501M3A SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES in 28-pin FK package. Operational temperature range from -55°C to 125°C. Datasheet*) SN74BCT8373ADW IEEE STD 1149.1 (JTAG) BOUNDARY-SCAN TEST DEVICE WITH OCTAL D-TYPE LATCHES in 24-pin DW package. Operational temperature range from 0°C to 70°C. Datasheet*) SN74BCT8373ADWR IEEE STD 1149.1 (JTAG) BOUNDARY-SCAN TEST DEVICE WITH OCTAL D-TYPE LATCHES in 24-pin DW package. Operational temperature range from 0°C to 70°C. Datasheet*) SN74BCT8373ANT IEEE STD 1149.1 (JTAG) BOUNDARY-SCAN TEST DEVICE WITH OCTAL D-TYPE LATCHES in 24-pin NT package. Operational temperature range from 0°C to 70°C. Datasheet*) SNJ54BCT8373AFK SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES in 28-pin FK package. Operational temperature range from -55°C to 125°C. Datasheet*) SNJ54BCT8373AJT SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES in 24-pin JT package. Operational temperature range from -55°C to 125°C. Datasheet*)

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